Share Email Print

Proceedings Paper

Required material properties for high-efficiency CIGS modules
Author(s): Ingrid Repins; Stephen Glynn; Joel Duenow; Timothy J. Coutts; Wyatt K. Metzger; Miguel A. Contreras
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Relatively high proven efficiencies of CIGS devices are often cited regarding its choice as a semiconductor for photovoltaic manufacturing. Module efficiency is an important parameter, as a number of factors in the cost per watt are driven downward by increasing efficiency. Some of these factors include materials costs, throughput for a given capital investment, and installation costs. Thus, realizing high-efficiency (e.g. 15%) large-area CIGS modules is key in both reducing cost per watt and differentiating the technology from other thin films. This paper discusses the material properties required of each layer of the CIGS device such that large-area CIGS modules can achieve efficiencies 15%, which is substantially higher than the current industrial state-of-the-art. The sensitivity of module performance to the important material parameters is quantified based on both experimental data and modeling. Necessary performance differences between small-area devices and large-area modules imposed by geometry are also quantified. Potential technical breakthroughs that may relax the requirements for each layer are discussed.

Paper Details

Date Published: 20 August 2009
PDF: 14 pages
Proc. SPIE 7409, Thin Film Solar Technology, 74090M (20 August 2009); doi: 10.1117/12.828365
Show Author Affiliations
Ingrid Repins, National Renewable Energy Lab. (United States)
Stephen Glynn, National Renewable Energy Lab. (United States)
Joel Duenow, National Renewable Energy Lab. (United States)
Timothy J. Coutts, National Renewable Energy Lab. (United States)
Wyatt K. Metzger, National Renewable Energy Lab. (United States)
Miguel A. Contreras, National Renewable Energy Lab. (United States)

Published in SPIE Proceedings Vol. 7409:
Thin Film Solar Technology
Alan E. Delahoy; Louay A. Eldada, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?