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Proceedings Paper

Improvements to spectral spot-scanning technique for accurate and efficient data acquisition
Author(s): Jonathan D. Bray; Kevin M. Gaab; Bruce M. Lambert; Terrence S. Lomheim
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Paper Abstract

An improved and optimized spectral spot-scanning system for visible focal plane array (FPA) sub-micron pixel photoresponse testing is presented. This updated configuration includes: (1) additional diagnostic analysis tools which more completely characterize the operation of the system; (2) a confocal microscope fitted into the optical system to aid in more precise determination of spot focusing on the imager; (3) a post-acquisition transformation to imager pixel response data to reduce overall data acquisition time. Wavelength-dependent pixel response data is presented to demonstrate the repeatability of this setup as well as to quantify the impact of random and systematic experimental errors.

Paper Details

Date Published: 21 August 2009
PDF: 14 pages
Proc. SPIE 7405, Instrumentation, Metrology, and Standards for Nanomanufacturing III, 74050L (21 August 2009); doi: 10.1117/12.828292
Show Author Affiliations
Jonathan D. Bray, The Aerospace Corp. (United States)
Kevin M. Gaab, The Aerospace Corp. (United States)
Bruce M. Lambert, The Aerospace Corp. (United States)
Terrence S. Lomheim, The Aerospace Corp. (United States)

Published in SPIE Proceedings Vol. 7405:
Instrumentation, Metrology, and Standards for Nanomanufacturing III
Michael T. Postek; John A. Allgair, Editor(s)

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