In this paper, a quality-guided phase unwrapping method is proposed for a modified Fourier transform method, which utilizes a fringe image and a flat image. The proposed method takes advantage of the additional information provided by the flat image to calculate the visibility of the fringe pattern, which is difficult to obtain in the conventional Fourier transform method. The phase unwrapping process includes two steps. First, the pixels with unreliable phase values in the wrapped phase map are masked out. Then, visibility is chosen as a quality index to assist the quality-guided unwrapping. Experimental results show that the proposed method is an effective method to unwrap complex surface's phase map generated from dense fringe patterns.

Date Published: 17 June 2009
PDF: 9 pages
Proc. SPIE 7389, Optical Measurement Systems for Industrial Inspection VI, 73890B (17 June 2009); doi: 10.1117/12.827952

Published in SPIE Proceedings Vol. 7389:
Optical Measurement Systems for Industrial Inspection VI
Peter H. Lehmann, Editor(s)