Share Email Print

Proceedings Paper

Diffraction microtomography with sample rotation: primary result on the influence of a missing apple core in the recorded frequency space
Author(s): Stanislas Vertu; Ichiro Yamada; Jean-Jacques Delaunay; Olivier Haeberlé; Jens Flügge
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Diffraction microtomography in coherent light is foreseen as a promising technique to image transparent living samples in three dimensions without staining. Contrary to conventional microscopy with incoherent light, which gives morphological information only, diffraction microtomography makes it possible to obtain the complex optical refractive index of the observed sample by mapping a three-dimensional support in the spatial frequency domain. The technique can be implemented in two configurations, namely, by varying the sample illumination with a fixed sample or by rotating the sample using a fixed illumination. In the literature, only the former method was described in detail. In this report, we derive the three-dimensional frequency support that can be mapped by the sample rotation configuration. We found that, within the first-order Born approximation, the volume of the frequency domain that can be mapped exhibits a missing part, the shape of which resembles that of an apple core. A brightfield transmission microscope was modified to form a Mach-Zehnder interferometer that was used to generate phase-shifted holograms recorded in image plane. We report preliminary experimental results.

Paper Details

Date Published: 17 June 2009
PDF: 10 pages
Proc. SPIE 7390, Modeling Aspects in Optical Metrology II, 73901D (17 June 2009);
Show Author Affiliations
Stanislas Vertu, Physikalisch-Technische Bundesanstalt (Germany)
Ichiro Yamada, The Univ. of Tokyo (Japan)
Jean-Jacques Delaunay, The Univ. of Tokyo (Japan)
Olivier Haeberlé, Univ. de Haute Alsace (France)
Jens Flügge, Physikalisch-Technische Bundesanstalt (Germany)

Published in SPIE Proceedings Vol. 7390:
Modeling Aspects in Optical Metrology II
Harald Bosse; Bernd Bodermann; Richard M. Silver, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?