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Proceedings Paper

Profilometry of semiconductor components by two-colour holography with Bi12TiO20 crystals
Author(s): André Oliveira Preto; Eduardo Acedo Barbosa
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Paper Abstract

We studied the shape measurement of semiconductor components by holography with photorefractive Bi12TiO20 crystal as holographic medium and two diode lasers emitting in the red region as light sources. By properly tuning and aligning the lasers a synthetic wavelength was generated and the resulting holographic image of the studied object appears modulated by cos2-contour fringes which correspond to the intersection of the object surface with planes of constant elevation. The position of such planes as a function of the illuminating beam angle and the tuning of the lasers was studied, as well as the fringe visibility. The fringe evaluation was performed by the four stepping technique for phase mapping and through the branch-cut method for phase unwrapping. A damage in an integrated circuit was analysed as well as the relief of a coin was measured, and a precision up to 10 μm was estimated.

Paper Details

Date Published: 17 June 2009
PDF: 7 pages
Proc. SPIE 7389, Optical Measurement Systems for Industrial Inspection VI, 73890R (17 June 2009); doi: 10.1117/12.827533
Show Author Affiliations
André Oliveira Preto, CEETEPS, UNESP (Brazil)
Eduardo Acedo Barbosa, CEETEPS, UNESP (Brazil)

Published in SPIE Proceedings Vol. 7389:
Optical Measurement Systems for Industrial Inspection VI
Peter H. Lehmann, Editor(s)

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