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Proceedings Paper

Performance analysis of interrogators for fiber Bragg grating sensors based on arrayed waveguide gratings
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Paper Abstract

Fiber Bragg grating (FBG) sensors have proven to be adaptable for monitoring various physical quantitites like temperature, strain, or even vibrations and acoustic noise. Several interrogation methods, like spectroscopic evaluation, interferometric interrogation, active scanning or active filtering systems or passive filtering systems are capable of monitoring the wavelengths of the FBG sensors. Among the passive filtering systems, interrogators based on arrayed waveguide gratings (AWG) have shown to be promising candidates for sensing with FBGs, especially for high-frequency measurement tasks. Whereas the resolution- and the accuracy-dependency on light intensity of direct wavelength determining systems like spectrometers or scanning filter systems can be minimized by data processing algorithms, the performance of passive filtering based interrogators is more sensitive regarding uncertainties induced by electrical amplifier noise, FBG peak shape, light source intensity, etc.. The influence of different sources of uncertainties for AWGbased interrogators on the accuracy of the wavelength determination are investigated by an analytical model. The model is evaluated by a numerical simulation. It is shown how strongly the accuracy and the resolution of such an interrogator depend on the mentioned sources of uncertainties. Considering the obtained results, one can say that FBG interrogators based on arrayed waveguide gratings have, including the shown restrictions, the potential for rugged, compact and cost effective high accuracy wavelength interrogators.

Paper Details

Date Published: 17 June 2009
PDF: 9 pages
Proc. SPIE 7389, Optical Measurement Systems for Industrial Inspection VI, 738930 (17 June 2009); doi: 10.1117/12.827526
Show Author Affiliations
Thorbjörn C. Buck, Technische Univ. München (Germany)
Mathias S. Müller, Technische Univ. München (Germany)
Markus Plattner, Technische Univ. München (Germany)
Alexander W. Koch, Technische Univ. München (Germany)

Published in SPIE Proceedings Vol. 7389:
Optical Measurement Systems for Industrial Inspection VI
Peter H. Lehmann, Editor(s)

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