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Proceedings Paper

3D synchrotron x-ray microtomography of paint samples
Author(s): Ester S. B. Ferreira; Jaap J. Boon; Jerre van der Horst; Nadim C. Scherrer; Federica Marone; Marco Stampanoni
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Paper Abstract

Synchrotron based X-ray microtomography is a novel way to examine paint samples. The three dimensional distribution of pigment particles, binding media and their deterioration products as well as other features such as voids, are made visible in their original context through a computing environment without the need of physical sectioning. This avoids manipulation related artefacts. Experiments on paint chips (approximately 500 micron wide) were done on the TOMCAT beam line (TOmographic Microscopy and Coherent rAdiology experimenTs) at the Paul Scherrer Institute in Villigen, CH, using an x-ray energy of up to 40 keV. The x-ray absorption images are obtained at a resolution of 350 nm. The 3D dataset was analysed using the commercial 3D imaging software Avizo 5.1. Through this process, virtual sections of the paint sample can be obtained in any orientation. One of the topics currently under research are the ground layers of paintings by Cuno Amiet (1868- 1961), one of the most important Swiss painters of classical modernism, whose early work is currently the focus of research at the Swiss Institute for Art Research (SIK-ISEA). This technique gives access to information such as sample surface morphology, porosity, particle size distribution and even particle identification. In the case of calcium carbonate grounds for example, features like microfossils present in natural chalks, can be reconstructed and their species identified, thus potentially providing information towards the mineral origin. One further elegant feature of this technique is that a target section can be selected within the 3D data set, before exposing it to obtain chemical data. Virtual sections can then be compared with cross sections of the same samples made in the traditional way.

Paper Details

Date Published: 15 July 2009
PDF: 8 pages
Proc. SPIE 7391, O3A: Optics for Arts, Architecture, and Archaeology II, 73910L (15 July 2009); doi: 10.1117/12.827511
Show Author Affiliations
Ester S. B. Ferreira, Swiss Institute for Art Research (Switzerland)
Jaap J. Boon, Swiss Institute for Art Research (Switzerland)
FOM Institute for Atomic and Molecular Physics (Netherlands)
Jerre van der Horst, FOM Institute for Atomic and Molecular Physics (Netherlands)
Nadim C. Scherrer, Swiss Institute for Art Research (Switzerland)
Bern Univ. of Applied Sciences (Switzerland)
Federica Marone, Paul Scherrer Institute (Switzerland)
Marco Stampanoni, Paul Scherrer Institute (Switzerland)

Published in SPIE Proceedings Vol. 7391:
O3A: Optics for Arts, Architecture, and Archaeology II
Luca Pezzati; Renzo Salimbeni, Editor(s)

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