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Proceedings Paper

Spatial elliptical polariscope for polarization distribution measurements
Author(s): Wladyslaw A. Wozniak; Slawomir Drobczynski; Piotr Kurzynowski
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Paper Abstract

We propose a new setup established to measure the light polarization state and the birefringent media parameters. This setup consists of two pairs of the linear Wollaston compensators and special circular compensators which form a set of two spatially modulated elliptical compensators. These compensators can be used separately as a spatial generator of all polarization states and as an elliptical spatial analyzer. When analyzing the light polarization state the singular minimum points in the output light intensity appear. The coordinates of these points depend linearly on the azimuth and ellipticity angles of the examined light. When combining both elements (generator and compensator) we can obtain a special spatial elliptical polariscope. It allows measuring the main birefringent media parameters: the azimuth and the ellipticity angle of its both eigenvectors as well as the phase difference, introduced by this medium. All desired quantities could be obtained by some simple intensity measurements and neither movable parts nor active elements are needed and no complicated analysis of output light should be made. We propose also a modification of described setup by using different shearing angles in Wollaston compensators used in generator and analyzer. This should allow using Fourier analysis of the output intensity distribution and makes our devices more suitable to real time measurements.

Paper Details

Date Published: 17 June 2009
PDF: 10 pages
Proc. SPIE 7390, Modeling Aspects in Optical Metrology II, 739009 (17 June 2009); doi: 10.1117/12.827505
Show Author Affiliations
Wladyslaw A. Wozniak, Wroclaw Univ. of Technology (Poland)
Slawomir Drobczynski, Wroclaw Univ. of Technology (Poland)
Piotr Kurzynowski, Wroclaw Univ. of Technology (Poland)

Published in SPIE Proceedings Vol. 7390:
Modeling Aspects in Optical Metrology II
Harald Bosse; Bernd Bodermann; Richard M. Silver, Editor(s)

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