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Proceedings Paper

Surface quality control in diamond abrasive finishing
Author(s): Yuriy D. Filatov; Volodymyr I. Sidorko; Olexandr Yu. Filatov; Vasil P. Yaschuk; Uwe Heisel; Michael Storchak
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Paper Abstract

The paper presents a procedure for measuring laser radiation reflection and scattering coefficients of polished surface. A relation between the scattered light intensity and the polished surface roughness is studied. It is demonstrated that colorimetric characteristics of non-metallic materials can be determined from the light scattering and reflection coefficients. This work has demonstrated a possibility of and created prerequisites for the development of an express method for tentative assessment of polished surface roughness. Of interest is the use of the β(Rz) function for the purposes of quality inspection of polished surfaces of natural and synthetic stone and other non-metallic materials. It was established that the most relevant parameter of roughness, which can be defined by the light reflection is Rz. The Dependency of the reflection factor from parameter of roughness Rz was approximated by formula with inaccuracy 5-10%. Inaccuracy of the determination of roughness Rz has formed 1%. It was shown that method of the surface roughness control using the light reflection factor is the most efficient for surfaces with roughness Rz <0.3 microns, typical for finish diamond-abrasive machining.

Paper Details

Date Published: 17 June 2009
PDF: 9 pages
Proc. SPIE 7389, Optical Measurement Systems for Industrial Inspection VI, 73892O (17 June 2009); doi: 10.1117/12.827368
Show Author Affiliations
Yuriy D. Filatov, Bakul Institute for Superhard Materials (Ukraine)
Volodymyr I. Sidorko, Bakul Institute for Superhard Materials (Ukraine)
Olexandr Yu. Filatov, National Taras Shevchenko Univ. of Kyiv (Ukraine)
Vasil P. Yaschuk, National Taras Shevchenko Univ. of Kyiv (Ukraine)
Uwe Heisel, Univ. Stuttgart (Germany)
Michael Storchak, Univ. Stuttgart (Germany)


Published in SPIE Proceedings Vol. 7389:
Optical Measurement Systems for Industrial Inspection VI
Peter H. Lehmann, Editor(s)

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