
Proceedings Paper
Structural damage identification based on laser ultrasonic propagation imaging technologyFormat | Member Price | Non-Member Price |
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Paper Abstract
An ultrasonic propagation imaging (UPI) system consisted of a Q-switched Nd-YAG pulsed laser and a galvanometer
laser mirror scanner was developed. The system which requires neither reference data nor fixed focal length could be
used for health monitoring of curved structures. If combined with a fiber acoustic wave PZT (FAWPZT) sensor, it could
be used to inspect hot target structures that present formidable challenges to the usage of contact piezoelectric
transducers mainly due to the operating temperature limitation of transducers and debonding problem due to the
mismatch of coefficient of thermal expansion between the target, transducer and bonding material. The inspection of a
stainless steel plate with a curvature radius of about 4 m, having 2mm×1mm open-crack was demonstrated at 150°C
using a FAWPZT sensor welded on the plate. Highly-curved surfaces scanning capability and adaptivity of the system
for large laser incident angle up to 70° was demonstrated on a stainless steel cylinder with 2mm×1mm open-crack. The
imaging results were presented in ultrasonic propagation movie which was a moving wavefield emerged from an
installed ultrasonic sensor. Damages were localized by the scattering wavefields. The result images enabled easy
detection and interpretation of structural defects as anomalies during ultrasonic wave propagation.
Paper Details
Date Published: 17 June 2009
PDF: 9 pages
Proc. SPIE 7389, Optical Measurement Systems for Industrial Inspection VI, 73891S (17 June 2009); doi: 10.1117/12.827241
Published in SPIE Proceedings Vol. 7389:
Optical Measurement Systems for Industrial Inspection VI
Peter H. Lehmann, Editor(s)
PDF: 9 pages
Proc. SPIE 7389, Optical Measurement Systems for Industrial Inspection VI, 73891S (17 June 2009); doi: 10.1117/12.827241
Show Author Affiliations
Chen-Ciang Chia, Chonbuk National Univ. (Korea, Republic of)
Si-Gwang Jang, Chonbuk National Univ. (Korea, Republic of)
Si-Gwang Jang, Chonbuk National Univ. (Korea, Republic of)
Jung-Ryul Lee, Chonbuk National Univ. (Korea, Republic of)
Dong-Jin Yoon, Korea Research Institute of Standards and Science (Korea, Republic of)
Dong-Jin Yoon, Korea Research Institute of Standards and Science (Korea, Republic of)
Published in SPIE Proceedings Vol. 7389:
Optical Measurement Systems for Industrial Inspection VI
Peter H. Lehmann, Editor(s)
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