Share Email Print

Proceedings Paper

Dual mode interferometer for measuring dynamic displacement of specular and diffuse components
Author(s): Michael North Morris; Tim Horner; Markar Naradikian; Joe Shiefman
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

We present a dual mode interferometer system based on a single-frame phase acquisition sensor that is capable of measuring the dynamic displacement of both specular and diffuse components. The single frame acquisition allows the interferometer to freeze the motions of the test articles in both configurations and examine the dynamic nature of the surface figure under dynamic stress. The system has applications in the testing of dynamic optical components such as deformable mirrors as well as defect detection and structural stability of composite materials. This paper will provide an overview of the interferometer design, outline the different measurement configurations and present measurement results of dynamically excited test articles.

Paper Details

Date Published: 10 September 2009
PDF: 11 pages
Proc. SPIE 7432, Optical Inspection and Metrology for Non-Optics Industries, 74320W (10 September 2009); doi: 10.1117/12.827090
Show Author Affiliations
Michael North Morris, 4D Technology Corp. (United States)
Tim Horner, 4D Technology Corp. (United States)
Markar Naradikian, 4D Technology Corp. (United States)
Joe Shiefman, 4D Technology Corp. (United States)

Published in SPIE Proceedings Vol. 7432:
Optical Inspection and Metrology for Non-Optics Industries
Peisen S. Huang; Toru Yoshizawa; Kevin G. Harding, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?