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Proceedings Paper

Accelerated testing of metal foil tape joints and their effect of photovoltaic module reliability
Author(s): N. Robert Sorensen; Michael A. Quintana; Joseph D. Puskar; Samuel J. Lucero
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Paper Abstract

A program is underway at Sandia National Laboratories to predict long-term reliability of photovoltaic (PV) systems. The vehicle for the reliability predictions is a Reliability Block Diagram (RBD), which models system behavior. Because this model is based mainly on field failure and repair times, it can be used to predict current reliability, but it cannot currently be used to accurately predict lifetime. In order to be truly predictive, physics-informed degradation processes and failure mechanisms need to be included in the model. This paper describes accelerated life testing of metal foil tapes used in thin-film PV modules, and how tape joint degradation, a possible failure mode, can be incorporated into the model.

Paper Details

Date Published: 20 August 2009
PDF: 11 pages
Proc. SPIE 7412, Reliability of Photovoltaic Cells, Modules, Components, and Systems II, 74120R (20 August 2009); doi: 10.1117/12.826876
Show Author Affiliations
N. Robert Sorensen, Sandia National Labs. (United States)
Michael A. Quintana, Sandia National Labs. (United States)
Joseph D. Puskar, Sandia National Labs. (United States)
Samuel J. Lucero, Sandia National Labs. (United States)

Published in SPIE Proceedings Vol. 7412:
Reliability of Photovoltaic Cells, Modules, Components, and Systems II
Neelkanth G. Dhere; John H. Wohlgemuth; Dan T. Ton, Editor(s)

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