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Proceedings Paper

Studies of neutral AlmCn clusters employing a table-top soft x-ray laser
Author(s): F. Dong; S. Heinbuch; J. J. Rocca; E. R. Bernstein
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Paper Abstract

Neutral AlmCn clusters are investigated both experimentally and theoretically for the first time. Single photon ionization through 193 nm, and 46.9 nm lasers is used to detected neutral cluster distributions. AlmCn clusters are generated through laser ablation of a mixture of Al and C powders pressed into a disk. An oscillation of the VIEs of AlmCn clusters is observed in the experiments. The ionization energies of AlmCn clusters change as a function of the numbers of Al and C atoms in the clusters. Theoretical density functional theory and ab initio calculations are carried out to explore the structures, ionization energies, and molecular orbitals of the AlmCn clusters. C=C bonds are favored for the lowest energy structures for AlmCn clusters. Based on calculations of HOMOs (highest occupied molecular orbitals) of AlmCn clusters we find that the ionization energies of these clusters do not simply depend on open or closed shell valence electron configurations, but also depend on the electronic structure details of the clusters. The calculational results provide good and consistent explanations of the experimental observations, and are consistent with them.

Paper Details

Date Published: 28 September 2009
PDF: 9 pages
Proc. SPIE 7451, Soft X-Ray Lasers and Applications VIII, 74510Q (28 September 2009); doi: 10.1117/12.826333
Show Author Affiliations
F. Dong, NSF Engineering Research Ctr. for Extreme Ultraviolet Science and Technology, Colorado State Univ. (United States)
S. Heinbuch, NSF Engineering Research Ctr. for Extreme Ultraviolet Science and Technology, Colorado State Univ. (United States)
J. J. Rocca, NSF Engineering Research Ctr. for Extreme Ultraviolet Science and Technology, Colorado State Univ. (United States)
E. R. Bernstein, NSF Engineering Research Ctr. for Extreme Ultraviolet Science and Technology, Colorado State Univ. (United States)


Published in SPIE Proceedings Vol. 7451:
Soft X-Ray Lasers and Applications VIII
James Dunn; Gregory J. Tallents, Editor(s)

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