
Proceedings Paper
Negative refraction in split-ring-resonator stack at normal incidenceFormat | Member Price | Non-Member Price |
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Paper Abstract
Metamaterials building blocks, from microwave to optical range are mainly based on metal-dielectric
composite. In almost all structures with true negative index (not coming from
losses) two kind of meta-atoms (electric and magnetic) are mixed in order to drive
simultaneously the effective permittivity and permeability to negative values and thus to
obtain a negative index of refraction. In this paper we show that two coupled structures with
localized plasmons modes (e.g. Cut wires or Split-Ring-Resonators) can exhibit negative
refractive index by their own, by appropriately controlling the hybridization scheme of the so
called plasmons modes. As a result, the metallic filling factor is drastically reduced and low
losses especially at optical frequencies may allow realistic applications of metamaterials.
Paper Details
Date Published: 1 September 2009
PDF: 5 pages
Proc. SPIE 7392, Metamaterials: Fundamentals and Applications II, 73921O (1 September 2009); doi: 10.1117/12.826259
Published in SPIE Proceedings Vol. 7392:
Metamaterials: Fundamentals and Applications II
Mikhail A. Noginov; Nikolay I. Zheludev; Allan D. Boardman; Nader Engheta, Editor(s)
PDF: 5 pages
Proc. SPIE 7392, Metamaterials: Fundamentals and Applications II, 73921O (1 September 2009); doi: 10.1117/12.826259
Show Author Affiliations
B. Kanté, Institut d'Électronique Fondamentale, CNRS, Univ. Paris-Sud (France)
R. Ghasemi, Institut d'Électronique Fondamentale, CNRS, Univ. Paris-Sud (France)
R. Ghasemi, Institut d'Électronique Fondamentale, CNRS, Univ. Paris-Sud (France)
A. de Lustrac, Institut d'Électronique Fondamentale, CNRS, Univ. Paris-Sud (France)
J.-M. Lourtioz, Institut d'Électronique Fondamentale, CNRS, Univ. Paris-Sud (France)
J.-M. Lourtioz, Institut d'Électronique Fondamentale, CNRS, Univ. Paris-Sud (France)
Published in SPIE Proceedings Vol. 7392:
Metamaterials: Fundamentals and Applications II
Mikhail A. Noginov; Nikolay I. Zheludev; Allan D. Boardman; Nader Engheta, Editor(s)
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