
Proceedings Paper
Soft gamma-ray optics: new Laue lens design and performance estimatesFormat | Member Price | Non-Member Price |
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Paper Abstract
Laue lenses are an emerging technology based on diffraction in crystals that allows the concentration of soft
gamma rays. This kind of optics that works in the 100 keV - 1.5 MeV band can be used to realize an highsensitivity
and high-angular resolution telescope (in a narrow field of view). This paper reviews the recent
progresses that have been done in the development of efficient crystals, in the design study and in the modelisation
of the answer of Laue lenses. Through the example of a new concept of 20 m focal length lens focusing in the 100
keV - 600 keV band, the performance of a telescope based on a Laue lens is presented. This lens, uses the most
efficient mosaic crystals in each sub-energy range in order to yield the maximum reflectivity. Imaging capabilities
are investigated and shows promising results.
Paper Details
Date Published: 31 August 2009
PDF: 11 pages
Proc. SPIE 7437, Optics for EUV, X-Ray, and Gamma-Ray Astronomy IV, 74370K (31 August 2009); doi: 10.1117/12.826138
Published in SPIE Proceedings Vol. 7437:
Optics for EUV, X-Ray, and Gamma-Ray Astronomy IV
Stephen L. O'Dell; Giovanni Pareschi, Editor(s)
PDF: 11 pages
Proc. SPIE 7437, Optics for EUV, X-Ray, and Gamma-Ray Astronomy IV, 74370K (31 August 2009); doi: 10.1117/12.826138
Show Author Affiliations
Nicolas M. Barrière, INAF-IASF (Italy)
Lorenzo Natalucci, INAF-IASF (Italy)
Nikolay Abrosimov, IKZ (Germany)
Peter von Ballmoos, CESR, CNRS (France)
Pierre Bastie, LSP, CNRS (France)
Lorenzo Natalucci, INAF-IASF (Italy)
Nikolay Abrosimov, IKZ (Germany)
Peter von Ballmoos, CESR, CNRS (France)
Pierre Bastie, LSP, CNRS (France)
Pierre Courtois, ILL (France)
Michael Jentschel, ILL (France)
Jürgen Knödlseder, CESR, CNRS (France)
Julien Rousselle, CESR, CNRS (France)
Pietro Ubertini III, INAF-IASF (Italy)
Michael Jentschel, ILL (France)
Jürgen Knödlseder, CESR, CNRS (France)
Julien Rousselle, CESR, CNRS (France)
Pietro Ubertini III, INAF-IASF (Italy)
Published in SPIE Proceedings Vol. 7437:
Optics for EUV, X-Ray, and Gamma-Ray Astronomy IV
Stephen L. O'Dell; Giovanni Pareschi, Editor(s)
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