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Proceedings Paper

Picometer metrology for the GAIA Mission
Author(s): E. A. Meijer; J. N. Nijenhuis; R. J. P. Vink; F. Kamphues; W. Gielesen; C. Coatantiec
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Paper Abstract

To measure the relative motions of GAIA's telescopes, the angle between the telescopes is monitored by an all Silicon Carbide Basic Angle Monitoring subsystem (BAM OMA). TNO is developing this metrology system. The stability requirements for this metrology system go into the pico meter and pico radian range. Such accuracies require extreme measures and extreme stability. Specific topics addressed are mountings of opto-mechanical components, gravity deformation, materials and tests that were necessary to prove that the requirements are feasible. Especially mounting glass components on Silicon Carbide and mastering the Silicon Carbide material proved to be a challenge.

Paper Details

Date Published: 17 September 2009
PDF: 10 pages
Proc. SPIE 7439, Astronomical and Space Optical Systems, 743915 (17 September 2009); doi: 10.1117/12.826124
Show Author Affiliations
E. A. Meijer, TNO Science and Industry (Netherlands)
J. N. Nijenhuis, TNO Science and Industry (Netherlands)
R. J. P. Vink, TNO Science and Industry (Netherlands)
F. Kamphues, TNO Science and Industry (Netherlands)
W. Gielesen, TNO Science and Industry (Netherlands)
C. Coatantiec, EADS Astrium Toulouse (France)

Published in SPIE Proceedings Vol. 7439:
Astronomical and Space Optical Systems
Penny G. Warren; James B. Heaney; Robert K. Tyson; Michael Hart; E. Todd Kvamme; Cheryl J. Marshall, Editor(s)

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