
Proceedings Paper
Product reliability and thin-film photovoltaicsFormat | Member Price | Non-Member Price |
---|---|---|
$17.00 | $21.00 |
Paper Abstract
Despite significant growth in photovoltaics (PV) over the last few years, only approximately 1.07 billion kWhr of
electricity is estimated to have been generated from PV in the US during 2008, or 0.27% of total electrical generation.
PV market penetration is set for a paradigm shift, as fluctuating hydrocarbon prices and an acknowledgement of the
environmental impacts associated with their use, combined with breakthrough new PV technologies, such as thin-film
and BIPV, are driving the cost of energy generated with PV to parity or cost advantage versus more traditional forms of
energy generation.
In addition to reaching cost parity with grid supplied power, a key to the long-term success of PV as a viable energy
alternative is the reliability of systems in the field. New technologies may or may not have the same failure modes as
previous technologies. Reliability testing and product lifetime issues continue to be one of the key bottlenecks in the
rapid commercialization of PV technologies today. In this paper, we highlight the critical need for moving away from
relying on traditional qualification and safety tests as a measure of reliability and focus instead on designing for
reliability and its integration into the product development process. A drive towards quantitative predictive accelerated
testing is emphasized and an industrial collaboration model addressing reliability challenges is proposed.
Paper Details
Date Published: 20 August 2009
PDF: 15 pages
Proc. SPIE 7412, Reliability of Photovoltaic Cells, Modules, Components, and Systems II, 74120N (20 August 2009); doi: 10.1117/12.825415
Published in SPIE Proceedings Vol. 7412:
Reliability of Photovoltaic Cells, Modules, Components, and Systems II
Neelkanth G. Dhere; John H. Wohlgemuth; Dan T. Ton, Editor(s)
PDF: 15 pages
Proc. SPIE 7412, Reliability of Photovoltaic Cells, Modules, Components, and Systems II, 74120N (20 August 2009); doi: 10.1117/12.825415
Show Author Affiliations
Ryan Gaston, The Dow Chemical Co. (United States)
Rebekah Feist, The Dow Chemical Co. (United States)
Simon Yeung, The Dow Chemical Co. (United States)
Mike Hus, The Dow Chemical Co. (United States)
Mark Bernius, The Dow Chemical Co. (United States)
Marc Langlois, The Dow Chemical Co. (United States)
Scott Bury, The Dow Chemical Co. (United States)
Rebekah Feist, The Dow Chemical Co. (United States)
Simon Yeung, The Dow Chemical Co. (United States)
Mike Hus, The Dow Chemical Co. (United States)
Mark Bernius, The Dow Chemical Co. (United States)
Marc Langlois, The Dow Chemical Co. (United States)
Scott Bury, The Dow Chemical Co. (United States)
Jennifer Granata, Sandia National Labs. (United States)
Michael Quintana, Sandia National Labs. (United States)
Carl Carlson, ReliaSoft Corp. (United States)
Georgios Sarakakis, ReliaSoft Corp. (United States)
Douglas Ogden, ReliaSoft Corp. (United States)
Adamantios Mettas, ReliaSoft Corp. (United States)
Michael Quintana, Sandia National Labs. (United States)
Carl Carlson, ReliaSoft Corp. (United States)
Georgios Sarakakis, ReliaSoft Corp. (United States)
Douglas Ogden, ReliaSoft Corp. (United States)
Adamantios Mettas, ReliaSoft Corp. (United States)
Published in SPIE Proceedings Vol. 7412:
Reliability of Photovoltaic Cells, Modules, Components, and Systems II
Neelkanth G. Dhere; John H. Wohlgemuth; Dan T. Ton, Editor(s)
© SPIE. Terms of Use
