
Proceedings Paper
Use of a scanning optical profilometer for toolmark characterizationFormat | Member Price | Non-Member Price |
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Paper Abstract
An optical profilometer has been used to obtain 3-dimensional data for use in two research projects
concerning toolmark quantification and identification. In the first study quantitative comparisons
between toolmarks made using data from the optical system proved superior to similar data obtained
using a stylus profilometer. In the second study the ability of the instrument to obtain accurate data
from two surfaces intersecting at a high angle (approximately 90 degrees) is demonstrated by
obtaining measurements from the tip of a flat screwdriver. The data obtained was used to produce a
computer generated "virtual tool," which was then employed to create "virtual tool marks." How
these experiments were conducted and the results obtained will be presented and discussed.
Paper Details
Date Published: 22 May 2009
PDF: 8 pages
Proc. SPIE 7378, Scanning Microscopy 2009, 73782D (22 May 2009); doi: 10.1117/12.825185
Published in SPIE Proceedings Vol. 7378:
Scanning Microscopy 2009
Michael T. Postek; Michael T. Postek; Michael T. Postek; Dale E. Newbury; Dale E. Newbury; Dale E. Newbury; S. Frank Platek; S. Frank Platek; S. Frank Platek; David C. Joy; David C. Joy; David C. Joy, Editor(s)
PDF: 8 pages
Proc. SPIE 7378, Scanning Microscopy 2009, 73782D (22 May 2009); doi: 10.1117/12.825185
Show Author Affiliations
L. S. Chumbley, Iowa State Univ. (United States)
D. J. Eisenmann, Iowa State Univ. (United States)
M. Morris, Iowa State Univ. (United States)
S. Zhang, Iowa State Univ. (United States)
D. J. Eisenmann, Iowa State Univ. (United States)
M. Morris, Iowa State Univ. (United States)
S. Zhang, Iowa State Univ. (United States)
J. Craft, Iowa State Univ. (United States)
C. Fisher, Iowa State Univ. (United States)
A. Saxton, Iowa State Univ. (United States)
C. Fisher, Iowa State Univ. (United States)
A. Saxton, Iowa State Univ. (United States)
Published in SPIE Proceedings Vol. 7378:
Scanning Microscopy 2009
Michael T. Postek; Michael T. Postek; Michael T. Postek; Dale E. Newbury; Dale E. Newbury; Dale E. Newbury; S. Frank Platek; S. Frank Platek; S. Frank Platek; David C. Joy; David C. Joy; David C. Joy, Editor(s)
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