
Proceedings Paper
Method to measure frequency change of tunable laser based on Jamin shearing interferometerFormat | Member Price | Non-Member Price |
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Paper Abstract
A method to measure the frequency change of the tunable laser based on a Jamin shearing interferometer is proposed.
The Jamin shearing interferometer is composed of two Jamin plates, two shearing plates and a retardation plate. The
tunable laser beam is split into two beams by one Jamin plate. The retardation plate is placed in one of two beams to
provide additional phase retardation. Two beams pass two shearing plates, respectively, and are combined by the other
Jamin plate to form lateral shearing interferogram. In course of tuning, interference fringes are shifted as a whole and its
spacing is kept constant. By detecting displacement of fringes, the frequency change of the laser is obtained. In
experiments, we observed that interference fringes were shift periodically when the laser diode was modulated
sinusoidally. A series of interferogram in which fringes are shifted as a whole with the variation of the frequency are
obtained. The feasibility of the method is verified.
Paper Details
Date Published: 10 September 2009
PDF: 7 pages
Proc. SPIE 7432, Optical Inspection and Metrology for Non-Optics Industries, 743218 (10 September 2009); doi: 10.1117/12.824681
Published in SPIE Proceedings Vol. 7432:
Optical Inspection and Metrology for Non-Optics Industries
Peisen S. Huang; Toru Yoshizawa; Kevin G. Harding, Editor(s)
PDF: 7 pages
Proc. SPIE 7432, Optical Inspection and Metrology for Non-Optics Industries, 743218 (10 September 2009); doi: 10.1117/12.824681
Show Author Affiliations
Lijuan Wang, Shanghai Institute of Optics and Fine Mechanics (China)
Liren Liu, Shanghai Institute of Optics and Fine Mechanics (China)
Jianfeng Sun, Shanghai Institute of Optics and Fine Mechanics (China)
Liren Liu, Shanghai Institute of Optics and Fine Mechanics (China)
Jianfeng Sun, Shanghai Institute of Optics and Fine Mechanics (China)
Published in SPIE Proceedings Vol. 7432:
Optical Inspection and Metrology for Non-Optics Industries
Peisen S. Huang; Toru Yoshizawa; Kevin G. Harding, Editor(s)
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