
Proceedings Paper
Imaging performance and test of extreme ultraviolet telescopeFormat | Member Price | Non-Member Price |
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Paper Abstract
The Extreme Ultraviolet Telescope (EUT) is composed of a set of four individual normal incidence multilayer-coated
telescopes that obtained selected spectrum bandpass (131 A-304 A) of the solar atmosphere. Before the launch, it is
necessary to calibrate the imaging performance of EUT. We build a test system for EUT by two ways. Resolution test
was performed using 1951 Standard Air Force High Resolution Test target, and the optical resolution limits down to
0.96arc-second at 404.7nm. A pinhole as a target placed on the focal point of a collimator is illuminated mercury lump.
The intensity distribution is obtained by knife-edge scanning with low noise photon-counting detector. The slope of the
knife-edge scan is equal to the value of the line spread function (LSF). Based on these measurement, we calculate the e
modulation transfer function, which is highly closed to the simulation result of zemax. The experiment result indicates
that the test system works well. For further work, the working wavelength test will be done with the help of those
experiment results.
Paper Details
Date Published: 31 August 2009
PDF: 7 pages
Proc. SPIE 7437, Optics for EUV, X-Ray, and Gamma-Ray Astronomy IV, 74371R (31 August 2009); doi: 10.1117/12.824549
Published in SPIE Proceedings Vol. 7437:
Optics for EUV, X-Ray, and Gamma-Ray Astronomy IV
Stephen L. O'Dell; Giovanni Pareschi, Editor(s)
PDF: 7 pages
Proc. SPIE 7437, Optics for EUV, X-Ray, and Gamma-Ray Astronomy IV, 74371R (31 August 2009); doi: 10.1117/12.824549
Show Author Affiliations
Lin Yang, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Graduate Univ. of the Chinese Academy of Sciences (China)
Tiangang Cui, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Graduate Univ. of the Chinese Academy of Sciences (China)
Graduate Univ. of the Chinese Academy of Sciences (China)
Tiangang Cui, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Graduate Univ. of the Chinese Academy of Sciences (China)
Bo Chen, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Published in SPIE Proceedings Vol. 7437:
Optics for EUV, X-Ray, and Gamma-Ray Astronomy IV
Stephen L. O'Dell; Giovanni Pareschi, Editor(s)
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