
Proceedings Paper
Optimizing computing resources for optimal throughput in a mask data preparation flowFormat | Member Price | Non-Member Price |
---|---|---|
$17.00 | $21.00 |
Paper Abstract
The data volume is increasing exponentially in mask data preparation (MDP) flows for sub-45nm technologies, but
time to market drives the acceptable total turnaround time. As a reasonable response, more computing resources are
purchased to address these two issues. How to effectively use these resources including the latest CPUs, high-speed
networking, and the fastest data storage devices is becoming an urgent problem to solve. A detailed study is conducted in
an attempt to find an optimal solution to this problem. In particular, how CPU speed, bandwidth of network connections,
and I/O speed of data storage devices affect the total turnaround time (TAT) in a mask data preparation flow is
researched. For a given High Performance Computing (HPC) budget and MDP flow TAT constraints, methodologies to
optimize HPC resources are proposed.
Paper Details
Date Published: 11 May 2009
PDF: 11 pages
Proc. SPIE 7379, Photomask and Next-Generation Lithography Mask Technology XVI, 73792Y (11 May 2009); doi: 10.1117/12.824349
Published in SPIE Proceedings Vol. 7379:
Photomask and Next-Generation Lithography Mask Technology XVI
Kunihiro Hosono, Editor(s)
PDF: 11 pages
Proc. SPIE 7379, Photomask and Next-Generation Lithography Mask Technology XVI, 73792Y (11 May 2009); doi: 10.1117/12.824349
Show Author Affiliations
Weidong Zhang, Mentor Graphics Corp. (United States)
Ron Bennett, Mentor Graphics Corp. (United States)
Pradiptya Ghosh, Mentor Graphics Corp. (United States)
Ron Bennett, Mentor Graphics Corp. (United States)
Pradiptya Ghosh, Mentor Graphics Corp. (United States)
Steffen Schulze, Mentor Graphics Corp. (United States)
Amanda Bowhill, Mentor Graphics Corp. (United States)
Amanda Bowhill, Mentor Graphics Corp. (United States)
Published in SPIE Proceedings Vol. 7379:
Photomask and Next-Generation Lithography Mask Technology XVI
Kunihiro Hosono, Editor(s)
© SPIE. Terms of Use
