Proceedings Paper
Out-of-plane deformation dynamic measurement method by using virtual speckle pattern based on Carré algorithm| Format | Member Price | Non-Member Price |
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Paper Abstract
Temporal carrier has been introduced to electronic speckle interferometry (ESPI) in order to produce virtual speckle
patterns. Dynamic deformation measurement with a large deformation is performed by using virtual speckle patterns.
However, it takes a long calculating time to produce virtual speckle patterns, because the method requires Fourier
transform operation at each pixel of CCD. In the proposed method, virtual speckle patterns are produced by algorithm
without Fourier transform. As the results, it is confirmed that the calculating cost of virtual speckle patterns is improved
remarkably, and that the new method also is equal to the ordinary methods in measurement accuracy.
Paper Details
Date Published: 17 June 2009
PDF: 9 pages
Proc. SPIE 7389, Optical Measurement Systems for Industrial Inspection VI, 73890I (17 June 2009); doi: 10.1117/12.824186
Published in SPIE Proceedings Vol. 7389:
Optical Measurement Systems for Industrial Inspection VI
Peter H. Lehmann, Editor(s)
PDF: 9 pages
Proc. SPIE 7389, Optical Measurement Systems for Industrial Inspection VI, 73890I (17 June 2009); doi: 10.1117/12.824186
Show Author Affiliations
S. Yokozeki, Jyouko Applied Optics Lab. (Japan)
Published in SPIE Proceedings Vol. 7389:
Optical Measurement Systems for Industrial Inspection VI
Peter H. Lehmann, Editor(s)
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