Share Email Print

Proceedings Paper

EUV imaging experiment of an adaptive optics telescope
Author(s): S. Kitamoto; T. Shibata; E. Takenaka; M. Yoshida; H. Murakami; Y. Shishido; N. Gotoh; K. Nagasaki; D. Takei; M. Morii
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

We report an experimental result of our normal-incident EUV telescope tuned to a 13.5 nm band, with an adaptive optics. The optics consists of a spherical primary mirror and a secondary mirror. Both are coated by Mo/Si multilayer. The diameter of the primary and the secondary mirrors are 80 mm and 55mm, respectively. The secondary mirror is a deformable mirror with 31 bimorph-piezo electrodes. The EUV from a laser plasma source was exposed to a Ni mesh with 31 micro-m wires. The image of this mesh was obtained by a backilluminated CCD. The reference wave was made by an optical laser source with 1 μm pin-hole. We measure the wave form of this reference wave and control the secondary mirror to get a good EUV image. Since the paths of EUV and the optical light for the reference were different from each other, we modify the target wave from to control the deformable mirror, as the EUV image is best. The higher order Zernike components of the target wave form, as well as the tilts and focus components, were added to the reference wave form made by simply calculated. We confirmed the validity of this control and performed a 2.1 arc-sec resolution.

Paper Details

Date Published: 31 August 2009
PDF: 8 pages
Proc. SPIE 7437, Optics for EUV, X-Ray, and Gamma-Ray Astronomy IV, 74371I (31 August 2009); doi: 10.1117/12.824122
Show Author Affiliations
S. Kitamoto, Rikkyo Univ. (Japan)
T. Shibata, Rikkyo Univ. (Japan)
E. Takenaka, Rikkyo Univ. (Japan)
M. Yoshida, Rikkyo Univ. (Japan)
H. Murakami, Rikkyo Univ. (Japan)
Y. Shishido, Rikkyo Univ. (Japan)
N. Gotoh, Rikkyo Univ. (Japan)
K. Nagasaki, Rikkyo Univ. (Japan)
D. Takei, Rikkyo Univ. (Japan)
M. Morii, Tokyo Institute of Technology (Japan)

Published in SPIE Proceedings Vol. 7437:
Optics for EUV, X-Ray, and Gamma-Ray Astronomy IV
Stephen L. O'Dell; Giovanni Pareschi, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?