
Proceedings Paper
Novel ultra-lightweight and high-resolution MEMS x-ray opticsFormat | Member Price | Non-Member Price |
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Paper Abstract
We have been developing ultra light-weight X-ray optics using MEMS (Micro Electro Mechanical Systems)
technologies.We utilized crystal planes after anisotropic wet etching of silicon (110) wafers as X-ray mirrors and
succeeded in X-ray reflection and imaging. Since we can etch tiny pores in thin wafers, this type of optics can
be the lightest X-ray telescope. However, because the crystal planes are alinged in certain directions, we must
approximate ideal optical surfaces with flat planes, which limits angular resolution of the optics on the order of
arcmin. In order to overcome this issue, we propose novel X-ray optics based on a combination of five recently
developed MEMS technologies, namely silicon dry etching, X-ray LIGA, silicon hydrogen anneal, magnetic fluid
assisted polishing and hot plastic deformation of silicon. In this paper, we describe this new method and report
on our development of X-ray mirrors fabricated by these technologies and X-ray reflection experiments of two
types of MEMS X-ray mirrors made of silicon and nickel. For the first time, X-ray reflections on these mirrors
were detected in the angular response measurements. Compared to model calculations, surface roughness of the
silicon and nickel mirrors were estimated to be 5 nm and 3 nm, respectively.
Paper Details
Date Published: 30 April 2009
PDF: 9 pages
Proc. SPIE 7360, EUV and X-Ray Optics: Synergy between Laboratory and Space, 73600C (30 April 2009); doi: 10.1117/12.823933
Published in SPIE Proceedings Vol. 7360:
EUV and X-Ray Optics: Synergy between Laboratory and Space
René Hudec; Ladislav Pina, Editor(s)
PDF: 9 pages
Proc. SPIE 7360, EUV and X-Ray Optics: Synergy between Laboratory and Space, 73600C (30 April 2009); doi: 10.1117/12.823933
Show Author Affiliations
Ikuyuki Mitsuishi, Japan Aerospace Exploration Agency (Japan)
Yuichiro Ezoe, Tokyo Metropolitan Univ. (Japan)
Utako Takagi, Tokyo Metropolitan Univ. (Japan)
Makoto Mita, Japan Aerospace Exploration Agency (Japan)
Raul Riveros, Univ. of Florida (United States)
Hitomi Yamaguchi, Univ. of Florida (United States)
Fumiki Kato, Ritsumeikan-Global Innovation Research Organization (Japan)
Susumu Sugiyama, Ritsumeikan-Global Innovation Research Organization (Japan)
Yuichiro Ezoe, Tokyo Metropolitan Univ. (Japan)
Utako Takagi, Tokyo Metropolitan Univ. (Japan)
Makoto Mita, Japan Aerospace Exploration Agency (Japan)
Raul Riveros, Univ. of Florida (United States)
Hitomi Yamaguchi, Univ. of Florida (United States)
Fumiki Kato, Ritsumeikan-Global Innovation Research Organization (Japan)
Susumu Sugiyama, Ritsumeikan-Global Innovation Research Organization (Japan)
Kouzou Fujiwara, Tohoku Univ. (Japan)
Kohei Morishita, Tohoku Univ. (Japan)
Kazuo Nakajima, Tohoku Univ. (Japan)
Shinya Fujihira, Tohoku Univ. (Japan)
Yoshiaki Kanamori, Tohoku Univ. (Japan)
Noriko Y. Yamasaki, Japan Aerospace Exploration Agency (Japan)
Kazuhisa Mitsuda, Japan Aerospace Exploration Agency (Japan)
Ryutaro Maeda, National Institute of Advanced Industrial Science and Technology (Japan)
Kohei Morishita, Tohoku Univ. (Japan)
Kazuo Nakajima, Tohoku Univ. (Japan)
Shinya Fujihira, Tohoku Univ. (Japan)
Yoshiaki Kanamori, Tohoku Univ. (Japan)
Noriko Y. Yamasaki, Japan Aerospace Exploration Agency (Japan)
Kazuhisa Mitsuda, Japan Aerospace Exploration Agency (Japan)
Ryutaro Maeda, National Institute of Advanced Industrial Science and Technology (Japan)
Published in SPIE Proceedings Vol. 7360:
EUV and X-Ray Optics: Synergy between Laboratory and Space
René Hudec; Ladislav Pina, Editor(s)
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