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Proceedings Paper

Advanced concepts in nanomanipulations
Author(s): Gabriel T. Raicu; Costel I. Stanca
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Paper Abstract

Atomic force microscopes and scanning tunneling microscopes can be used to look at surfaces and to move atoms around. By designing different tips for these microscopes, they can be used for carving out structures on surfaces and to help guide self-assembling structures. The top-down approach anticipates nanodevices that must be built piece by piece in stages, much as manufactured items are made. The properties such as non-linearity, oversensitivity to environmental parameters, geometrical/material-dependence, etc. result in the particular design of each nanomanipulation task according to specific conditions and disturbances. The precision and the speed of nanomanipulation are two important factors in the construction of a dimensionally well-defined pattern in a minimum amount of time.

Paper Details

Date Published: 7 January 2009
PDF: 5 pages
Proc. SPIE 7297, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies IV, 72971Z (7 January 2009); doi: 10.1117/12.823683
Show Author Affiliations
Gabriel T. Raicu, Constanta Maritime Univ. (Romania)
Costel I. Stanca, Constanta Maritime Univ. (Romania)

Published in SPIE Proceedings Vol. 7297:
Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies IV
Paul Schiopu; Cornel Panait; George Caruntu; Adrian Manea, Editor(s)

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