
Proceedings Paper
Mössbauer backscattering measurements on SnFormat | Member Price | Non-Member Price |
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Paper Abstract
We prove the possibility to make superficial measurements in the nano or micro range by Mossbauer spectroscopy using 119Sn Mossbauer isotope. Measurements were made with a new flow gas detector in a backscattering geometry. With this detector was possibly to detect conversion electron or low energy X-ray. A β-Sn metallic foil sample was used. These measurements were performed for the first time in Romania. After our knowledge the detection of low energy X-ray for 119Sn is realized for the first time in the world.
Paper Details
Date Published: 7 January 2009
PDF: 4 pages
Proc. SPIE 7297, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies IV, 72971T (7 January 2009); doi: 10.1117/12.823676
Published in SPIE Proceedings Vol. 7297:
Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies IV
Paul Schiopu; Cornel Panait; George Caruntu; Adrian Manea, Editor(s)
PDF: 4 pages
Proc. SPIE 7297, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies IV, 72971T (7 January 2009); doi: 10.1117/12.823676
Show Author Affiliations
I. Bibicu, Institute for Materials Phyiscs (Romania)
G. Nicolescu, Horia Hulubei National Institute of Physics and Nuclear Engineering (Romania)
G. Nicolescu, Horia Hulubei National Institute of Physics and Nuclear Engineering (Romania)
C. Cretu, Transilvania Univ. (Romania)
Published in SPIE Proceedings Vol. 7297:
Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies IV
Paul Schiopu; Cornel Panait; George Caruntu; Adrian Manea, Editor(s)
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