Share Email Print

Proceedings Paper

Surface observation and measurement by means of digital holographic microscope with arbitrary degree of coherence
Author(s): Luděk Lovicar; Lukáš Kvasnica; Radim Chmelík
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

The application of digital holographic microscope (DHM) imaging and inspection of fine surface structures, dimensions of which are in the range from units of nanometers up to units of micrometers in optical axis direction, is described in this paper. Accurate results of surface structures measurement, in the case the surface profile height is of three orders range, is achieved by simultaneous processing of optically sectioned image intensity and image phase. Surface profile height is roughly specified by the image intensity and the precise height information is acquired from the image phase. Full width at half maximum of the axial intensity response is adjusted properly for particular specimen by the modification of the spectral function of illumination and by resizing of the incoherent illumination source. It means the intervention into spatial and temporal coherence of the illumination. The content of this paper is the description of imaging characteristics of the DHM for individual illumination modes together with experimental results.

Paper Details

Date Published: 20 November 2008
PDF: 8 pages
Proc. SPIE 7141, 16th Polish-Slovak-Czech Optical Conference on Wave and Quantum Aspects of Contemporary Optics, 71411S (20 November 2008); doi: 10.1117/12.822410
Show Author Affiliations
Luděk Lovicar, Brno Univ. of Technology (Czech Republic)
Lukáš Kvasnica, Brno Univ. of Technology (Czech Republic)
Radim Chmelík, Brno Univ. of Technology (Czech Republic)

Published in SPIE Proceedings Vol. 7141:
16th Polish-Slovak-Czech Optical Conference on Wave and Quantum Aspects of Contemporary Optics
Agnieszka Popiolek-Masajada; Elzbieta Jankowska; Waclaw Urbanczyk, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?