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Proceedings Paper

A generic x-ray tracing toolbox in Geant4
Author(s): Giuseppe Vacanti; Ernst-Jan Buis; Maximilien Collon; Marco Beijersbergen; Chris Kelly
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Paper Abstract

We have developed a generic X-ray tracing toolbox based on Geant4, a generic simulation toolkit. By leveraging the facilities available on Geant4, we are able to design and analyze complex X-ray optical systems. In this article we describe our toolbox, and describe how it is being applied to support the development of silicon pore optics for IXO.

Paper Details

Date Published: 30 April 2009
PDF: 8 pages
Proc. SPIE 7360, EUV and X-Ray Optics: Synergy between Laboratory and Space, 73600Z (30 April 2009); doi: 10.1117/12.821768
Show Author Affiliations
Giuseppe Vacanti, cosine (Netherlands)
Ernst-Jan Buis, cosine (Netherlands)
Maximilien Collon, cosine (Netherlands)
Marco Beijersbergen, cosine (Netherlands)
Chris Kelly, cosine (Netherlands)


Published in SPIE Proceedings Vol. 7360:
EUV and X-Ray Optics: Synergy between Laboratory and Space
René Hudec; Ladislav Pina, Editor(s)

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