Share Email Print

Proceedings Paper

Fast detection of toxic industrial compounds by laser ion mobility spectrometry
Author(s): Carola Oberhuettinger; Andreas Langmeier; Helmut Oberpriller; Matthias Kessler; Johann Goebel; Gerhard Mueller
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Trace detection of toxic industrial compounds has been investigated with the help of a laser ion mobility spectrometer (LIMS). The LIMS was equipped with a tuneable UV laser source for enabling two-photon ionization of the analyte gases and an ion drift tube for the measurement of the ion mobility. Different aromatic and aliphatic hydrocarbons as well as amines were investigated. We find that the first class of molecules can be well ionized due to the delocalization of their valence electron shells and the second due to the presence of non-bonding electrons in lone-pair orbitals. Selectivity of detection is attained on the basis of molecule-specific photo-ionization and drift time spectra. Ion currents were found to scale linearly with the substance concentration over several orders of magnitude down to the detection limits in the ppt range. As besides toxic industrial compounds, similar electron configurations also occur in illicit drugs, toxins and pharmaceutical substances, LIMS can be applied in a variety of fields ranging from environmental analysis, air pollution monitoring, drug detection and chemical process monitoring.

Paper Details

Date Published: 30 April 2009
PDF: 8 pages
Proc. SPIE 7312, Advanced Environmental, Chemical, and Biological Sensing Technologies VI, 73120S (30 April 2009); doi: 10.1117/12.820855
Show Author Affiliations
Carola Oberhuettinger, EADS (Germany)
Andreas Langmeier, EADS (Germany)
Helmut Oberpriller, EADS (Germany)
Matthias Kessler, EADS (Germany)
Johann Goebel, EADS (Germany)
Gerhard Mueller, EADS (Germany)

Published in SPIE Proceedings Vol. 7312:
Advanced Environmental, Chemical, and Biological Sensing Technologies VI
Tuan Vo-Dinh; Robert A. Lieberman; Günter Gauglitz, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?