Proceedings Paper
Measurement technology of image contrast based on CCD| Format | Member Price | Non-Member Price |
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Paper Abstract
This paper introduces a new high accuracy measuring method for dimension measurement in industry and a new concept of measurement of image contrast. The new point is to use algorithm of subpixel based on spatial moments and technology of image contrast estimate the exact location of edge within a pixel. The non-linear filter, edge location and subpixel applied in measurement are discussed. More important with the spatial moment and the subdivision technology the accuracy of edge location is improved lots. Real time industrial measure results demonstrates the super advantage of high accuracy dimensional measurement technology be maximum bias within 0.01 mm. Conclusion and discussion are given finally.
Paper Details
Date Published: 31 December 2008
PDF: 6 pages
Proc. SPIE 7130, Fourth International Symposium on Precision Mechanical Measurements, 713040 (31 December 2008); doi: 10.1117/12.819703
Published in SPIE Proceedings Vol. 7130:
Fourth International Symposium on Precision Mechanical Measurements
Yetai Fei; Kuang-Chao Fan; Rongsheng Lu, Editor(s)
PDF: 6 pages
Proc. SPIE 7130, Fourth International Symposium on Precision Mechanical Measurements, 713040 (31 December 2008); doi: 10.1117/12.819703
Show Author Affiliations
Pengfei Hao, Taiyuan Univ. of Technology (China)
Wenji Si, Taiyuan Satellite Launch Ctr. (China)
Xiaodong Zhang, Taiyuan Univ. of Technology (China)
Wenji Si, Taiyuan Satellite Launch Ctr. (China)
Xiaodong Zhang, Taiyuan Univ. of Technology (China)
Yuanzong Li, Taiyuan Univ. of Technology (China)
Lihong Zheng, Taiyuan Univ. of Technology (China)
Lihong Zheng, Taiyuan Univ. of Technology (China)
Published in SPIE Proceedings Vol. 7130:
Fourth International Symposium on Precision Mechanical Measurements
Yetai Fei; Kuang-Chao Fan; Rongsheng Lu, Editor(s)
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