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Proceedings Paper

Testing and analyzing system for electro-optics characteristics of LDs based on virtual instrumentation
Author(s): Fengli Gao; Shuxu Guo; Zhenguo Zhang; Siyao Yu; Shuang Zhang; Xiangxin Shao
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Paper Abstract

In this paper, a testing and analyzing system for volt-current and optic-power characteristics of semiconductor laser diodes (LDs) based on virtual instrumentation is designed and developed by using PCI-6014 DAQ. The design methods of hardware circuit and software for NI-DAQ are introduced. Some protective methods to LDs, such as driving current limit, avoiding electrical pulse and delay start-up etc. problems, are completely finished by the software, instead of mostly considering the resolvent on hardware circuits. The detailed tested data for the function and performance of the system is presented, and the every tested data of LDs indicates that the whole system is of excellent performance and stability to obtain the parameters of LDs.

Paper Details

Date Published: 31 December 2008
PDF: 7 pages
Proc. SPIE 7130, Fourth International Symposium on Precision Mechanical Measurements, 71303T (31 December 2008); doi: 10.1117/12.819696
Show Author Affiliations
Fengli Gao, Jilin Univ. (China)
Shuxu Guo, Jilin Univ. (China)
Zhenguo Zhang, Jilin Univ. (China)
Siyao Yu, Jilin Univ. (China)
Shuang Zhang, Jilin Univ. (China)
Xiangxin Shao, Jilin Univ. (China)

Published in SPIE Proceedings Vol. 7130:
Fourth International Symposium on Precision Mechanical Measurements
Yetai Fei; Kuang-Chao Fan; Rongsheng Lu, Editor(s)

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