
Proceedings Paper
A linear phase retrieval wave-front sensorFormat | Member Price | Non-Member Price |
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Paper Abstract
A method to retrieve small phase aberration from a single far-field image is proposed. It only needs to calibrate the
inherent aberration of the imaging system once, and then the difference between a single measured image with aberration
and the calibrated image with inherent aberration is got to retrieve the disturbed phase aberration by an approximate
linear relationship. Computer simulations are employed to analyze the performance of this linear phase retrieval (LPR)
wave-front sensor. The dynamic range of this method is discussed without noise to judge how small it is needed to
satisfy the method. The results show that the proposed small phase retrieval method works well when the RMS phase
error is less than 1.6 rad. The Linear Phase Retrieval wave-front sensor and the Hartmann-Shack wave-front sensor are
compared on the same stochastic wave-front aberration. The influence of different calculation condition on the retrieval
results is compared and analyzed. After analyzing the target resolution, it is thought that a reasonable target size is
advantageous to the retrieval precision. At the same time, the LPR sensor can realize the alike precision measurement by
using less detect cell, such as 8 pixelx8 pixel in our experiment. From the retrieval results of different orders, the error
rate are less than 0.25 and it is comparatively accurate to retrieve pre-35 order aberrations.
Paper Details
Date Published: 31 December 2008
PDF: 7 pages
Proc. SPIE 7130, Fourth International Symposium on Precision Mechanical Measurements, 713017 (31 December 2008); doi: 10.1117/12.819581
Published in SPIE Proceedings Vol. 7130:
Fourth International Symposium on Precision Mechanical Measurements
Yetai Fei; Kuang-Chao Fan; Rongsheng Lu, Editor(s)
PDF: 7 pages
Proc. SPIE 7130, Fourth International Symposium on Precision Mechanical Measurements, 713017 (31 December 2008); doi: 10.1117/12.819581
Show Author Affiliations
Min Li, Institute of Optics and Electronics (China)
Xin-Yang Li, Graduate School of the Chinese Academy of Sciences (China)
Xin-Yang Li, Graduate School of the Chinese Academy of Sciences (China)
Wen-Han Jiang, Graduate School of the Chinese Academy of Sciences (China)
Published in SPIE Proceedings Vol. 7130:
Fourth International Symposium on Precision Mechanical Measurements
Yetai Fei; Kuang-Chao Fan; Rongsheng Lu, Editor(s)
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