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Proceedings Paper

Evaluation of the crack growth characteristics of glass and ceramics based on crack length measurement using an ion-sputtered film
Author(s): G. Deng; K. Sakamoto; K. Ikeda; T. Nakanishi
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Paper Abstract

The crack length measurement method using an ion-sputtered film, proposed by the authors based on the change in the electric resistance of the film during the crack growth, was applied to the small crack growing in soda lime glass and alumina ceramics. Since the measurement system can record the electric resistance of the ion-sputtered film at a high sampling frequency of 125kHz, the crack lengths was measured almost continuously, and the relationship between the crack growth rate and the stress intensity factor were obtained in the whole regions from low crack growth rate to brittle fracture. The growth characteristics of the small crack under 1mm in alumina ceramics are clarified to be different from that of the large crack in the same materials; for example, the n values, which is defined as the constant in the Paris law relating the crack growth rate to the stress intensity factor, in the soda lime glass and the alumina ceramics obtained by this research are 74 to 96 and 530 to 580 respectively in the region I, and 12 to 15 and 17 to 25 respectively in the region II, that are different from the values obtained from a large crack, especially for the alumina ceramics.

Paper Details

Date Published: 31 December 2008
PDF: 6 pages
Proc. SPIE 7130, Fourth International Symposium on Precision Mechanical Measurements, 713003 (31 December 2008); doi: 10.1117/12.819538
Show Author Affiliations
G. Deng, Univ. of Miyazaki (Japan)
K. Sakamoto, Tokyo Electron Kyushu Ltd. (Japan)
K. Ikeda, Univ. of Miyazaki (Japan)
T. Nakanishi, Univ. of Miyazaki (Japan)


Published in SPIE Proceedings Vol. 7130:
Fourth International Symposium on Precision Mechanical Measurements
Yetai Fei; Kuang-Chao Fan; Rongsheng Lu, Editor(s)

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