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Proceedings Paper

Decentralized detection and patching of coverage holes in wireless sensor networks
Author(s): Jixing Yao; Guyu Zhang; Jinko Kanno; Rastko Selmic
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Paper Abstract

Detection and patching of coverage holes in Wireless Sensor Networks (WSNs) are important measures of Quality of Service (QoS) for security and other applications that emphasize sensor network coverage. In this paper, we model a WSN using simplicial complexes based on its communication graph by which the network can be represented as connections of sensor nodes without knowing exact locations of nodes. Thus, the coverage problem is converted to a connectivity problem under some assumptions presented in the paper. We discuss two major topics in this paper, namely sensor network coverage hole detection and patching. We present a novel, decentralized, coordinate-free, node-based coverage hole detection algorithm. The algorithm can be implemented on a single node with connectivity information gathered from one-hop away neighbors. Thus, the coverage hole detection algorithm can be run on individual nodes and does not require time-consuming, centralized data processing. The hole-patching algorithm is based on the concept of perpendicular bisector line. Every hole-boundary edge has a corresponding perpendicular bisector and new sensor nodes are deployed on hole-boundary bisectors. Deployment of new sensor nodes maintains network connectivity, while reduces coverage holes.

Paper Details

Date Published: 19 May 2009
PDF: 10 pages
Proc. SPIE 7352, Intelligent Sensing, Situation Management, Impact Assessment, and Cyber-Sensing, 73520V (19 May 2009); doi: 10.1117/12.819294
Show Author Affiliations
Jixing Yao, Louisiana Tech Univ. (United States)
Guyu Zhang, Louisiana Tech Univ. (United States)
Jinko Kanno, Louisiana Tech Univ. (United States)
Rastko Selmic, Louisiana Tech Univ. (United States)

Published in SPIE Proceedings Vol. 7352:
Intelligent Sensing, Situation Management, Impact Assessment, and Cyber-Sensing
Stephen Mott; John F. Buford; Gabriel Jakobson, Editor(s)

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