
Proceedings Paper
Longwave multispectral diffractive optic imaging spectrometerFormat | Member Price | Non-Member Price |
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Paper Abstract
Ann Arbor Sensor Systems is developing and experimenting with a Long Wave Multispectral Diffractive Optic
Imaging Spectrometer that operates in the 7 to 14 micron band. The instrument currently under development
is for fixed mount applications. The focal plane is an uncooled 320 x 240 30 micron pitch amorphous silicon
microbolometer array. With a spectral bandwidth of 220nm the unit is capable of resolving moderate to broad
spectral features. This paper will describe the physical characteristics and characterization of the experimental
device. Design trades and test data will be presented.
Paper Details
Date Published: 27 April 2009
PDF: 12 pages
Proc. SPIE 7334, Algorithms and Technologies for Multispectral, Hyperspectral, and Ultraspectral Imagery XV, 73340G (27 April 2009); doi: 10.1117/12.819070
Published in SPIE Proceedings Vol. 7334:
Algorithms and Technologies for Multispectral, Hyperspectral, and Ultraspectral Imagery XV
Sylvia S. Shen; Paul E. Lewis, Editor(s)
PDF: 12 pages
Proc. SPIE 7334, Algorithms and Technologies for Multispectral, Hyperspectral, and Ultraspectral Imagery XV, 73340G (27 April 2009); doi: 10.1117/12.819070
Show Author Affiliations
David Kryskowski, Ann Arbor Sensor Systems, LLC (United States)
Justin Renken, Ann Arbor Sensor Systems, LLC (United States)
Published in SPIE Proceedings Vol. 7334:
Algorithms and Technologies for Multispectral, Hyperspectral, and Ultraspectral Imagery XV
Sylvia S. Shen; Paul E. Lewis, Editor(s)
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