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Proceedings Paper

Development of a high-speed modulator for a W-band millimetre-wave imaging system
Author(s): Peng Yao; Christopher A. Schuetz; Shouyuan Shi; Julien Macario; Rownak Shireen; Dennis W. Prather
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Paper Abstract

Millimetre-wave (mmW) imaging has attracted significant research interests for the promises of allweather imaging and security scanning for military applications. Recently, we have developed a highsensitivity mmW imaging system based on photonic devices, which relies on optical up-conversion of the received mmW signal to generate detectable sidebands. For system with lower detector reponsivity, higher resolution and wider separation between sidebands and optical carrier, a high efficiency EO modulator that works in W-band is required. Since such system does not exist commercially, we were motivated to develop our own 94GHz phase modulator. In our previous publications, we have presented design, fabrication and preliminary characterization of Lithium Niobate (LN) based devices. We continue in this paper with our post-processing techniques, updated characterization results and the packaging method between antenna and modulator. Modulation efficiency >1W-1 has been achieved over W-band. Using a fin-coupler for antenna integration, we have obtained insertion loss less than 3dB. The packaged modulator has been installed in our imager. Initial scanning showed high-quality images of various objects.

Paper Details

Date Published: 29 April 2009
PDF: 11 pages
Proc. SPIE 7309, Passive Millimeter-Wave Imaging Technology XII, 73090L (29 April 2009); doi: 10.1117/12.819039
Show Author Affiliations
Peng Yao, Phase Sensitive Innovations, Inc. (United States)
Christopher A. Schuetz, Phase Sensitive Innovations, Inc. (United States)
Shouyuan Shi, Phase Sensitive Innovations, Inc. (United States)
Julien Macario, Univ. of Delaware (United States)
Rownak Shireen, Univ. of Delaware (United States)
Dennis W. Prather, Univ. of Delaware (United States)

Published in SPIE Proceedings Vol. 7309:
Passive Millimeter-Wave Imaging Technology XII
Roger Appleby; David A. Wikner, Editor(s)

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