Share Email Print

### Proceedings Paper

Upward continuation for clutter suppression in EMI sensing of subsurface UXO
Format Member Price Non-Member Price
PDF \$17.00 \$21.00

Paper Abstract

Clutter is the bane of electromagnetic induction (EMI) surveying for subsurface unexploded ordnance (UXO) under realistic circumstances. Relatively small near-surface metallic items can still produce significant signals simply because they are much closer to the sensor than the larger underlying target of interest. Based on measured, fully multi-static, scalar data at some typical elevation above the ground, one may infer a surface layer of equivalent sources that will produce that data. Without having to locate or characterize the actual targets, one can use these equivalent sources to predict complete vector field data that would be obtained at any elevation equal to or greater than that of the original data. Such computational upward continuation (UC) of signals successfully suppressed clutter in field data. This was even the case when the local clutter signal was significantly stronger than that of the broader underlying UXO response and was embedded directly within it. The success of the approach is directly tied to the fact that it relies on the governing physics.

Paper Details

Date Published: 4 May 2009
PDF: 10 pages
Proc. SPIE 7303, Detection and Sensing of Mines, Explosive Objects, and Obscured Targets XIV, 73030S (4 May 2009); doi: 10.1117/12.818682
Show Author Affiliations
Kevin O'Neill, U.S. Army Engineer Research and Development Ctr. (United States)
Dartmouth College (United States)
Benjamin E. Barrowes, U.S. Army Engineer Research and Development Ctr. (United States)
Dartmouth College (United States)
Fridon Shubitidze, Dartmouth College (United States)
Juan Pablo Fernández, Dartmouth College (United States)
Irma Shamatava, Dartmouth College (United States)

Published in SPIE Proceedings Vol. 7303:
Detection and Sensing of Mines, Explosive Objects, and Obscured Targets XIV
Russell S. Harmon; J. Thomas Broach; John H. Holloway Jr., Editor(s)