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Proceedings Paper

Fiber optics low-coherence IR interferometry for defense sensors manufacturing
Author(s): Wojtek J. Walecki; Fanny Szondy
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Paper Abstract

We present novel fiber optics low coherence interferometer apparatus, and novel probe for in-situ characterization of semiconductor structures for IR detector manufacturing. Probe does not exhibit polarization, or strain sensitivity observed in earlier invented systems. In addition it is demonstrated to be able to operate with varying length of optical fibers.

Paper Details

Date Published: 30 April 2009
PDF: 5 pages
Proc. SPIE 7322, Photonic Microdevices/Microstructures for Sensing, 73220K (30 April 2009); doi: 10.1117/12.818381
Show Author Affiliations
Wojtek J. Walecki, Sunrise Optical LLC (United States)
Fanny Szondy, Sunrise Optical LLC (United States)

Published in SPIE Proceedings Vol. 7322:
Photonic Microdevices/Microstructures for Sensing
Hai Xiao; Xudong Fan; Anbo Wang, Editor(s)

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