About 20 μm thick Ce-doped Lu₃Al₅O₁₂ thin films grown by Liquid Phase Epitaxy and thin plates of similar thickness prepared by mechanical cutting and polishing from Czochralski grown crystals are used in 2D-imaging experiment down to μm 2D-resolution. Their scintillation response is also measured under α-particle excitation and performance of film and bulk material is mutually compared. Furthermore, scintillation and thermoluminescence characteristics of UV emitting Sc-doped LuAG grown by Czochralski method are presented since this system is a candidate material for UV emission-based 2D sensors with improved diffraction limit with respect to the presently used Ce-doped aluminum garnets.

Date Published: 30 April 2009
PDF: 10 pages
Proc. SPIE 7310, Non-Intrusive Inspection Technologies II, 731008 (30 April 2009); doi: 10.1117/12.818358

Published in SPIE Proceedings Vol. 7310:
Non-Intrusive Inspection Technologies II
Brandon W. Blackburn, Editor(s)