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Proceedings Paper

Lu3Al5O12-based materials for high 2D-resolution scintillation detectors
Author(s): M. Nikl; J. Tous; J. A. Mares; P. Prusa; E. Mihokova; K. Blazek; A. Vedda; Yu. Zorenko; V. Gorbenko; V. Babin
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Paper Abstract

About 20 μm thick Ce-doped Lu3Al5O12 thin films grown by Liquid Phase Epitaxy and thin plates of similar thickness prepared by mechanical cutting and polishing from Czochralski grown crystals are used in 2D-imaging experiment down to μm 2D-resolution. Their scintillation response is also measured under α-particle excitation and performance of film and bulk material is mutually compared. Furthermore, scintillation and thermoluminescence characteristics of UV emitting Sc-doped LuAG grown by Czochralski method are presented since this system is a candidate material for UV emission-based 2D sensors with improved diffraction limit with respect to the presently used Ce-doped aluminum garnets.

Paper Details

Date Published: 30 April 2009
PDF: 10 pages
Proc. SPIE 7310, Non-Intrusive Inspection Technologies II, 731008 (30 April 2009); doi: 10.1117/12.818358
Show Author Affiliations
M. Nikl, Institute of Physics (Czech Republic)
J. Tous, Crytur Ltd. (Czech Republic)
J. A. Mares, Institute of Physics (Czech Republic)
P. Prusa, Institute of Physics (Czech Republic)
Czech Technical Univ. in Prague (Czech Republic)
E. Mihokova, Institute of Physics (Czech Republic)
Univ. of Milano-Bicocca (Italy)
K. Blazek, Crytur Ltd. (Czech Republic)
A. Vedda, Univ. of Milano-Bicocca (Italy)
Yu. Zorenko, Ivan Franko National Univ. of L'viv (Ukraine)
V. Gorbenko, Ivan Franko National Univ. of L'viv (Ukraine)
V. Babin, Univ. of Tartu (Estonia)

Published in SPIE Proceedings Vol. 7310:
Non-Intrusive Inspection Technologies II
Brandon W. Blackburn, Editor(s)

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