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Proceedings Paper

A novel clustering method using weighted sub-sampling for an infrared search and track system
Author(s): Byungin Choi; Sanghoon Nam; Jungsu Youn; Yukyung Yang; Sungho Kim; Joohyoung Lee; Yongchan Park
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Paper Abstract

In an infrared search and tracking (IRST) system, the clustering procedure which merges target pixels into one cluster requires larger computational load according to increasing clutters. In this paper, we propose a novel clustering method based on weighted sub-sampling to reduce clustering time and obtain suitable cluster in cluttered environment. A conventional sub-sampling method can reasonably reduce clustering time but cause large error, when obtaining cluster center. However, our proposed clustering method perform sub-sampling and assign specific weights which is the number of target pixels in sampling region to sub-sampled pixels to obtain suitable cluster center. After performing clustering procedure, the cluster center position is properly obtained using sampled pixels and their weights in the cluster. Therefore, our proposed method can not only reduce clustering time using a sub-sampling method, but also obtain proper cluster center using our proposed weights. To validate our proposed method, experimental results for several infrared and noise images are presented.

Paper Details

Date Published: 13 April 2009
PDF: 8 pages
Proc. SPIE 7340, Optical Pattern Recognition XX, 73400T (13 April 2009); doi: 10.1117/12.818298
Show Author Affiliations
Byungin Choi, Samsung Thales Co., Ltd. (Korea, Republic of)
Sanghoon Nam, Samsung Thales Co., Ltd. (Korea, Republic of)
Jungsu Youn, Samsung Thales Co., Ltd. (Korea, Republic of)
Yukyung Yang, Agency for Defense Development (Korea, Republic of)
Sungho Kim, Agency for Defense Development (Korea, Republic of)
Joohyoung Lee, Agency for Defense Development (Korea, Republic of)
Yongchan Park, Agency for Defense Development (Korea, Republic of)

Published in SPIE Proceedings Vol. 7340:
Optical Pattern Recognition XX
David P. Casasent; Tien-Hsin Chao, Editor(s)

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