Share Email Print
cover

Proceedings Paper

Deep level defect structure of SiC material by local cluster neural network
Author(s): Tomasz Pichlak; Stanislaw Jankowski
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Main goal of presented work was the construction of neural network for detection of deep defect centers in semiinsulating materials. The element of novelty is the implementation of local cluster function combined with the leave-one-out method, used to determine the appropriate structure of neural net.

Paper Details

Date Published: 6 November 2008
PDF: 6 pages
Proc. SPIE 7124, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2008, 712402 (6 November 2008); doi: 10.1117/12.817929
Show Author Affiliations
Tomasz Pichlak, Warsaw Univ. of Technology (Poland)
Stanislaw Jankowski, Warsaw Univ. of Technology (Poland)


Published in SPIE Proceedings Vol. 7124:
Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2008
Ryszard S. Romaniuk; Tomasz R. Wolinski, Editor(s)

© SPIE. Terms of Use
Back to Top
PREMIUM CONTENT
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?
close_icon_gray