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Proceedings Paper

Capacitance boost in ionic polymer metal composites due to electrode surface roughness
Author(s): Matteo Aureli; Weiyang Lin; Maurizio Porfiri
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Paper Abstract

In this paper, we analyze the effect of electrode surface roughness on the capacitance of Ionic Polymer Metal Composites (IPMCs). We use the linearized Poisson-Nernst-Planck (PNP) model to describe the steady-state spatial distribution of the electric potential and counterion concentration in the polymer region. We account for the electrode surface roughness by solving the PNP model in a three-dimensional region, whose planar dimensions are infinite and whose transverse dimension is varying in the neighborhood of a nominal constant thickness. In this framework, the electrode roughness is described by a zero-mean function whose key-features, such as spatial correlation and peak-to-peak variation, can be potentially inferred by IPMC microscopy. We use the method of asymptotic expansions to determine a second-order accurate solution of the PNP model in terms of the statistical properties of the electrode surface. Further, we establish a handleable closed-form expression for the IPMC capacitance that elucidates the interplay among the IPMC nominal dimensions, the statistical properties of the electrode surface, and the Debye screening length. We specialize our findings to isotropic surface roughness models, including random and fractal roughness. We validate our theoretical findings through extensive experimental work on Nafion-based IPMCs.

Paper Details

Date Published: 6 April 2009
PDF: 9 pages
Proc. SPIE 7287, Electroactive Polymer Actuators and Devices (EAPAD) 2009, 72871A (6 April 2009); doi: 10.1117/12.817750
Show Author Affiliations
Matteo Aureli, Polytechnic Institute of New York Univ. (United States)
Weiyang Lin, Polytechnic Institute of New York Univ. (United States)
Maurizio Porfiri, Polytechnic Institute of New York Univ. (United States)

Published in SPIE Proceedings Vol. 7287:
Electroactive Polymer Actuators and Devices (EAPAD) 2009
Yoseph Bar-Cohen; Thomas Wallmersperger, Editor(s)

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