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Proceedings Paper

High-power laser diodes at SCD: performance and reliability for defence and space applications
Author(s): Shlomo Risemberg; Yoram Karni; Genadi Klumel; Moshe Levy; Yuri Berk; Markus Rech; Hubert Becht; Bruno Frei
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Paper Abstract

High Power Laser Diode Arrays developed and produced at SCD-SemiConductor Devices support a number of advanced defence and space programs. High efficiency and unsurpassed reliability at high operating temperatures are mandatory features for those applications. We report lifetime results of high power bar stacks, operating in QCW mode that rely on a field-proven design comprising Al-free wafer material technology and hard soldering robust packaging. A variety of packaging platforms have been implemented and tested at very harsh environmental conditions. Results include a long operational lifetime study totaling 20 billion pulses monitored in the course of several years for 808 nm QCW bar stacks.. Additionally, we report results of demanding lifetime tests for space qualification performed on these stacks at different levels of current load in a unique combination with operational temperature cycles in the range of -10 ÷60 °C. Novel solutions for highly reliable water cooled devices designed for operation in long pulses at different levels of PRF, are also discussed. The cooling efficiency of microchannel coolers is preserved while reliability is improved.

Paper Details

Date Published: 9 May 2009
PDF: 12 pages
Proc. SPIE 7325, Laser Technology for Defense and Security V, 73250U (9 May 2009); doi: 10.1117/12.817729
Show Author Affiliations
Shlomo Risemberg, SCD - SemiConductor Devices (Israel)
Yoram Karni, SCD - SemiConductor Devices (Israel)
Genadi Klumel, SCD - SemiConductor Devices (Israel)
Moshe Levy, SCD - SemiConductor Devices (Israel)
Yuri Berk, SCD - SemiConductor Devices (Israel)
Markus Rech, Carl Zeiss Optronics GmbH (Germany)
Hubert Becht, Carl Zeiss Optronics GmbH (Germany)
Bruno Frei, LASAG AG (Switzerland)

Published in SPIE Proceedings Vol. 7325:
Laser Technology for Defense and Security V
Mark Dubinskii; Stephen G. Post, Editor(s)

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