
Proceedings Paper
Dimensional measurement traceability of 3D imaging dataFormat | Member Price | Non-Member Price |
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Paper Abstract
This paper discusses the concept of metrological traceability to the International System of Units (SI) unit of length, the
meter. We describe how metrological traceability is realized, give a recent example of the standardization of laser
trackers, and discuss progress and challenges to the traceability of 3D imaging data.
Paper Details
Date Published: 19 January 2009
PDF: 7 pages
Proc. SPIE 7239, Three-Dimensional Imaging Metrology, 72390E (19 January 2009); doi: 10.1117/12.816498
Published in SPIE Proceedings Vol. 7239:
Three-Dimensional Imaging Metrology
J. Angelo Beraldin; Geraldine S. Cheok; Michael McCarthy; Ulrich Neuschaefer-Rube D.V.M., Editor(s)
PDF: 7 pages
Proc. SPIE 7239, Three-Dimensional Imaging Metrology, 72390E (19 January 2009); doi: 10.1117/12.816498
Show Author Affiliations
Steve Phillips, National Institute of Standards and Technology (United States)
Michael Krystek, Physikalisch-Technische Bundesanstalt (Germany)
Michael Krystek, Physikalisch-Technische Bundesanstalt (Germany)
Craig Shakarji, National Institute of Standards and Technology (United States)
Kim Summerhays, MetroSage LLC (United States)
Kim Summerhays, MetroSage LLC (United States)
Published in SPIE Proceedings Vol. 7239:
Three-Dimensional Imaging Metrology
J. Angelo Beraldin; Geraldine S. Cheok; Michael McCarthy; Ulrich Neuschaefer-Rube D.V.M., Editor(s)
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