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Proceedings Paper

Dimensional measurement traceability of 3D imaging data
Author(s): Steve Phillips; Michael Krystek; Craig Shakarji; Kim Summerhays
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Paper Abstract

This paper discusses the concept of metrological traceability to the International System of Units (SI) unit of length, the meter. We describe how metrological traceability is realized, give a recent example of the standardization of laser trackers, and discuss progress and challenges to the traceability of 3D imaging data.

Paper Details

Date Published: 19 January 2009
PDF: 7 pages
Proc. SPIE 7239, Three-Dimensional Imaging Metrology, 72390E (19 January 2009); doi: 10.1117/12.816498
Show Author Affiliations
Steve Phillips, National Institute of Standards and Technology (United States)
Michael Krystek, Physikalisch-Technische Bundesanstalt (Germany)
Craig Shakarji, National Institute of Standards and Technology (United States)
Kim Summerhays, MetroSage LLC (United States)

Published in SPIE Proceedings Vol. 7239:
Three-Dimensional Imaging Metrology
J. Angelo Beraldin; Geraldine S. Cheok; Michael McCarthy; Ulrich Neuschaefer-Rube D.V.M., Editor(s)

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