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Proceedings Paper

Two-band DMD-based infrared scene simulator
Author(s): Julia Renta Dupuis; David J. Mansur; Robert Vaillancourt; Thomas Evans; David Carlson; Elizabeth Schundler
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Paper Abstract

OPTRA is developing a two-band midwave infrared (MWIR) scene simulator based on digital micromirror device (DMD) technology; this simulator is intended for training various IR threat detection systems that exploit the relative intensities of two separate MWIR spectral bands. Our approach employs two DMDs, one for each spectral band, and an efficient optical design which overlays the scenes reflected by each through a common telecentric projector lens. Other key components include two miniature thermal sources, bandpass filters, and a dichroic beam combiner. Through the use of pulse width modulation, we are able to control the relative intensities of objects simulated by the two channels thereby enabling realistic scene simulations of various targets and projectiles approaching the threat detection system. Performance projections support radiant intensity levels, resolution, bandwidth, and scene durations that meet the requirements for a host of IR threat detection test scenarios. The feasibility of our concept has been demonstrated through the design, build, and test of a breadboard two-band simulator. In this paper we present the design of a prototype two-band simulator which builds on our experience from the breadboard build. We describe the system level, optical, mechanical, and software/electrical designs in detail as well as system characterization and future test plans.

Paper Details

Date Published: 22 April 2009
PDF: 11 pages
Proc. SPIE 7301, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XIV, 73010E (22 April 2009); doi: 10.1117/12.815375
Show Author Affiliations
Julia Renta Dupuis, OPTRA, Inc. (United States)
David J. Mansur, OPTRA, Inc. (United States)
Robert Vaillancourt, OPTRA, Inc. (United States)
Thomas Evans, OPTRA, Inc. (United States)
David Carlson, OPTRA, Inc. (United States)
Elizabeth Schundler, OPTRA, Inc. (United States)

Published in SPIE Proceedings Vol. 7301:
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XIV
James A. Buford Jr.; Robert Lee Murrer Jr., Editor(s)

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