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Proceedings Paper

Research of the conical cavity high-energy laser energy meter energy loss compensation technique
Author(s): Xun Yu; Qian Li; Liang Nie; Xiaoyan Shang; Baoyuan Liu
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Paper Abstract

Because absolute quantity thermal laser energy meter based on conical cavity has some features, for example, wavelength adaptation range is wide and laser damage threshold value is high. It is used for the standard of the high-energy laser energy meter and extensively in the domain of the high energy laser measurement. However, laser energy will lose because of the heat exchange and the back scattering of the conical absorption cavity. Therefore, only after compensating and amending the loss, the exact measurement of the laser energy can be achieved. Aimed to the energy loss compensation problem of the conical cavity high-energy laser energy meter, firstly, according to the heat transfer theory, this paper analyzes the heat energy loss of the conical cavity due to the heat emission, the heat convection and the heat exchange, and construct the mathematical model of the heat energy loss, based on which measuring result is curved fit using the least squares technique, and is compensated and amended utilizing the fitting curve, whose measurement repetitiveness is 0.7%, from which we can know that measuring repetitiveness is increased consumedly. Secondly, according to the optics principles of reciprocity of the conical cavity inner face and the incident laser and utilizing complexification Simpson numerical method, the mathematical model of conical cavity jaw opening optical power density distribution and back scattering gross power is established, based on which measuring result is compensated and amended, the back scattering energy loss is about 0.5% to 2.5%, high-energy laser energy measuring accuracy is improved availably.

Paper Details

Date Published: 3 October 2008
PDF: 13 pages
Proc. SPIE 7155, Ninth International Symposium on Laser Metrology, 71552R (3 October 2008); doi: 10.1117/12.814601
Show Author Affiliations
Xun Yu, Xi'an Technological Univ. (China)
Qian Li, Xi'an Technological Univ. (China)
Liang Nie, Xi'an Technological Univ. (China)
Xiaoyan Shang, Xi'an Technological Univ. (China)
Baoyuan Liu, Xi'an Technological Univ. (China)

Published in SPIE Proceedings Vol. 7155:
Ninth International Symposium on Laser Metrology
Chenggen Quan; Anand Asundi, Editor(s)

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