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Proceedings Paper

Measurement of air-refractive-index fluctuation from frequency change using phase modulation homodyne interferometer and external cavity laser diode
Author(s): Masato Aketagawa; Yuta Hoshino; Masashi Ishige; Tuan Banh Quoc
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Paper Abstract

In the article, we propose a measurement method for a fluctuation of the air air-refractive refractive-index from the frequency measurement by combining a phase modulation homodyne interferometer (PMHI), an external cavity laser diode (ECLD) as the light source and a frequency stabilized laser (FSL) as the frequency reference. The PMHI, which is set in air environment, utilizes a Michelson interferometer and low low-thermal thermal-exp expansion ansion-glass (LTEG: the thermal expansion ratio: 2×10 10-7 K-1) for its main supporting structure. In the PMHI, a dark (or bright) interference fringe with a specific ) integer order N is converted to a null point by utilizing the phase modulation and the loc lock-in detection, and must be kept by use of the null null-method and the control on the ECLD frequency. Geometrical path change in the PMHI is neglected because of the ultra ultra-low low-thermal thermal-expansion condition. Therefore, at the null point for N-th order in the suff sufficient thermal icient condition, a fluctuation of the air air-refractive refractive-index can be measured by the ECLD frequency change, which is derived from a beat signal between the ECLD and the FSL. In the article, a measurement principle, instrumentation and experimental re results are discussed. sults

Paper Details

Date Published: 3 October 2008
PDF: 8 pages
Proc. SPIE 7155, Ninth International Symposium on Laser Metrology, 71551V (3 October 2008); doi: 10.1117/12.814568
Show Author Affiliations
Masato Aketagawa, Nagaoka Univ. of Technology (Japan)
Yuta Hoshino, Nagaoka Univ. of Technology (Japan)
Masashi Ishige, Nagaoka Univ. of Technology (Japan)
Tuan Banh Quoc, Nagaoka Univ. of Technology (Japan)

Published in SPIE Proceedings Vol. 7155:
Ninth International Symposium on Laser Metrology
Chenggen Quan; Anand Asundi, Editor(s)

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