
Proceedings Paper
Vaterite twist: microrheology with AOM controlled optical tweezersFormat | Member Price | Non-Member Price |
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Paper Abstract
Measurements of viscoelasticity in the microscopic regime are of interest in polymer solutions as well as in
microscopic structures such as cells. Viscoelasticity can be studied using a localized microrheometer based
on optical tweezers. We rotate a birefringent micron-sized calcium carbonate sphere crystallized in a vaterite
structure. By applying a time-dependent torque or using the time-dependent thermal torque, viscoelasticity can
be measured. The torque can be measured purely optically, by measuring the polarization state of the trapping
beam after passing through the particle. We control the torque by controlling the relative amplitudes of two
orthogonally circularly polarized components of the trapping beam with two acousto-optic modulators. This
allows a wide range of oscillation frequencies to be used. We demonstrate applications of the methods on several
systems.
Paper Details
Date Published: 6 February 2009
PDF: 9 pages
Proc. SPIE 7227, Complex Light and Optical Forces III, 72270D (6 February 2009); doi: 10.1117/12.814357
Published in SPIE Proceedings Vol. 7227:
Complex Light and Optical Forces III
Enrique J. Galvez; David L. Andrews; Jesper Glückstad, Editor(s)
PDF: 9 pages
Proc. SPIE 7227, Complex Light and Optical Forces III, 72270D (6 February 2009); doi: 10.1117/12.814357
Show Author Affiliations
Maren Funk, Technische Univ. München (Germany)
The Univ. of Queensland (Australia)
Simon J. Parkin, The Univ. of Queensland (Australia)
Timo A. Nieminen, The Univ. of Queensland (Australia)
The Univ. of Queensland (Australia)
Simon J. Parkin, The Univ. of Queensland (Australia)
Timo A. Nieminen, The Univ. of Queensland (Australia)
Norman R. Heckenberg, The Univ. of Queensland (Australia)
Halina Rubinsztein-Dunlop, The Univ. of Queensland (Australia)
Halina Rubinsztein-Dunlop, The Univ. of Queensland (Australia)
Published in SPIE Proceedings Vol. 7227:
Complex Light and Optical Forces III
Enrique J. Galvez; David L. Andrews; Jesper Glückstad, Editor(s)
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