
Proceedings Paper
New methods of H-SVMs for the classification of multi-spectral remote sensing imageryFormat | Member Price | Non-Member Price |
---|---|---|
$17.00 | $21.00 |
Paper Abstract
Through systematically analysises of existing multi-class SVMs (M-SVMs) methods, it is shown that hierarchy multi-class
SVMs (H-SVMs) can be relatively effective. Further analysis shown that existing methods that measure
separability between different classes are not suitable for kernel feature space. A new method is presented for
separability measure in feature space based on the characters of RBF kernel function and SVMs. Based on the new
separability measure, two kinds of H-SVMs, Binary Tree SVMs (BT SVMs) and Single Layer Clustering SVMs (SLC
SVMs) are presented. They are both implements of following ideal: the higher a pair of two sub-classes is in the
hierarchy, the easier to separate them. In this way, we can not only achieve classification accuracy by alleviate error
accumulation from top to bottom, but also rise classification speed by reduce support vectors in classifier. Experimental
results justify the rationality of the new separability measure and effectiveness of BT SVMs and SLC SVMs.
Paper Details
Date Published: 7 November 2008
PDF: 13 pages
Proc. SPIE 7147, Geoinformatics 2008 and Joint Conference on GIS and Built Environment: Classification of Remote Sensing Images, 714706 (7 November 2008); doi: 10.1117/12.813206
Published in SPIE Proceedings Vol. 7147:
Geoinformatics 2008 and Joint Conference on GIS and Built Environment: Classification of Remote Sensing Images
Lin Liu; Xia Li; Kai Liu; Xinchang Zhang, Editor(s)
PDF: 13 pages
Proc. SPIE 7147, Geoinformatics 2008 and Joint Conference on GIS and Built Environment: Classification of Remote Sensing Images, 714706 (7 November 2008); doi: 10.1117/12.813206
Show Author Affiliations
Hou Bin, Wuhan Univ. (China)
Published in SPIE Proceedings Vol. 7147:
Geoinformatics 2008 and Joint Conference on GIS and Built Environment: Classification of Remote Sensing Images
Lin Liu; Xia Li; Kai Liu; Xinchang Zhang, Editor(s)
© SPIE. Terms of Use
