Proceedings Paper
An atomic force microscopy study on fouling characteristics of modified PES membrane in submerged membrane bioreactor for domestic wastewater treatment| Format | Member Price | Non-Member Price |
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Paper Abstract
To investigate the fouling characteristics of modified PES membrane in submerged Membrane Bioreactor (MBR) for
domestic wastewater treatment, Atomic Force Microscope (AFM) study was conducted to analyze the microstructure
characteristics of PES membrane. Surface roughness and section analysis of both virgin and fouled membrane were
achieved by software of NanoScope 6.12. Compared to the virgin membrane, the average roughness (Ra), square average
roughness (Rms) and ten points average roughness (Rz) of fouled membrane were increased by 100.6nm, 133.7nm and
330.7nm respectively. The section analysis results indicated that the cake layer formed and membrane pore blocked were
the main causes for the increase of TMP. Micro-filtration resistance analysis was conducted to support the results of
AFM analysis. It is showed that membrane resistance, cake resistance, pore blocking and irreversible fouling resistance
is 0.755, 1.721 and 1.386 respectively, which contributed 20%, 44%, and 36%, respectively, to total resistance of
submerged MBR (at MLSS 6000mg/L and flux 21.9L/m2·h). The results proved that AFM could be used to properly
describe the fouling characteristics of modified PES membrane in submerged MBR through roughness and section
analysis.
Paper Details
Date Published: 12 January 2009
PDF: 6 pages
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71334I (12 January 2009); doi: 10.1117/12.810707
Published in SPIE Proceedings Vol. 7133:
Fifth International Symposium on Instrumentation Science and Technology
Jiubin Tan; Xianfang Wen, Editor(s)
PDF: 6 pages
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71334I (12 January 2009); doi: 10.1117/12.810707
Show Author Affiliations
Shuo Liu, Harbin Institute of Technology (China)
Harbin Normal Univ. (China)
Hongjun Han, Harbin Institute of Technology (China)
Harbin Normal Univ. (China)
Hongjun Han, Harbin Institute of Technology (China)
Yanping Liu, Beijing Univ. of Chemical Technology (China)
Baozhen Wang, Harbin Institute of Technology (China)
Baozhen Wang, Harbin Institute of Technology (China)
Published in SPIE Proceedings Vol. 7133:
Fifth International Symposium on Instrumentation Science and Technology
Jiubin Tan; Xianfang Wen, Editor(s)
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